The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Jan. 24, 2023
Applicant:
Rakuten Group, Inc., Tokyo, JP;
Inventors:
Daichi Hasegawa, Tokyo, JP;
Ryo Nishimura, Tokyo, JP;
Taisuke Fujii, Tokyo, JP;
Kengo Fujioka, Tokyo, JP;
Assignee:
RAKUTEN GROUP, INC., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0709 (2013.01);
Abstract
An abnormality determination system, comprising at least one processor configured to: acquire an index usable in abnormality determination about an occurrence of abnormality in a service providing system for providing a predetermined service; acquire plan data about a plan of the predetermined service; and execute the abnormality determination based on the index and the plan data.