The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Sep. 27, 2023
Applicant:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Inventors:

Abhishek Negi, Mayfield Heights, OH (US);

Douglas D. Fisher, Mayfield Heights, OH (US);

Jennifer M. Kite, Mayfield Heights, OH (US);

Ajai Singh, Mayfield Heights, OH (US);

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41865 (2013.01); G05B 19/41885 (2013.01);
Abstract

A system and method for monitoring and controlling an industrial process using a data model extensible to different industry applications. The system is configured to: receive data describing the industrial process from one or more data sources in a first format; contextualize and transform the data by determining one or more tags for the data, the one or more tags comprising context information describing characteristics of the entities involved in the industrial process; generate a data model describing the industrial process based on the one or more tags; receive a first indication from a user indicating a first industry application to which the data model will be applied; and extend the data model to include a second plurality of nodes representing entities associated with the first industry application and a second plurality of edges connecting the second plurality of nodes and describing relationships between the second plurality of nodes.


Find Patent Forward Citations

Quick Actions:

Negi, Abhishek. (2026). Monitoring and control platform for industrial equipment with extensible data model (U.S. Patent No. 12602033). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12602033

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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