The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Dec. 01, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Yujiro Yanai, Minamiashigara, JP;

Keisuke Kodama, Minamiashigara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G01S 17/08 (2006.01);
U.S. Cl.
CPC ...
G01S 17/08 (2013.01); G01S 7/4814 (2013.01);
Abstract

An object is to provide a distance measurement device capable of receiving measurement light reflected by an object by responding to a wide angle range with a high S/N ratio. The object is achieved by the distance measurement device including: an infrared light source; a light receiving section that receives an infrared ray emitted from the light source and reflected by an object; and a band-pass filter (BPF) member that is disposed on a light-receiving surface side of the light receiving section and through which the infrared ray is transmitted, in which the BPF member includes a BPF and a refraction member that is disposed in contact with the BPF and refracts the infrared ray.


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