The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
May. 19, 2023
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Mathias Hellwig, Emmering, DE;
Benedikt Lippert, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
Disclosed is a process for characterizing a fixture component of a test fixture. The fixture component comprises a test instrument interface and a device under test, DUT, interface. The process comprises connecting a test instrument to the test instrument interface; sequentially establishing a plurality of characterization setups for the fixture component; and characterizing at least one scattering, S, parameter of the respectively established characterization setup. The establishing respectively comprises one of: providing an open circuit at the DUT interface, providing a short circuit at the DUT interface, providing a further fixture component of the test fixture at the DUT interface via mated connectors, and providing a DUT at the DUT interface. This avoids inaccuracies, high cost and availability issues in connection with lead-out structures of test fixtures.