The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Nov. 22, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Matthias Ruengeler, Munich, DE;

Gregor Feldhaus, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/308 (2006.01);
U.S. Cl.
CPC ...
G01R 31/308 (2013.01);
Abstract

A measurement system is described. The measurement system includes at least one analog-to-digital converter (ADC), the at least one ADC being configured to receive and digitize a radio frequency (RF) signal, thereby obtaining a digitized RF signal. The measurement system further includes a digital signal processing circuit, the digital signal processing circuit being configured to receive and process the digitized RF signal. In some embodiments, the digital signal processing circuit is configured to: determine whether the at least one ADC is operated in an overload operating state based on the digitized RF signal; determine at least one time frame of the digitized RF signal in which the at least one ADC is operated in the overload operating state; and determine whether the at least one time frame corresponds to a critical portion of the RF signal or to an uncritical portion of the RF signal.


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