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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12601725 B1

PDFFull Text
Date of Patent:
Apr. 14, 2026

Filed:

Jan. 05, 2024

Long-term benthic incubation and measuring system and method

Applicant:

Florida Atlantic University Board of Trustees, Boca Raton, FL (US);

Inventors:

Jordon Beckler, Ft. Pierce, FL (US);

Csaba Vaczo, Ft. Pierce, FL (US);

Assignee:

FLORIDA ATLANTIC UNIVERSITY BOARD OF TRUSTEES, Boca Raton, FL (US);

Attorney:

Meunier Carlin & Curfman LLC

Primary Examiner:

Thomas M Hammond, III

Int. Cl.
CPC ...
G01N 33/18 (2006.01); G01N 1/02 (2006.01); G01N 1/10 (2006.01); G01N 1/14 (2006.01); G01N 1/38 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 33/18 (2013.01); G01N 1/14 (2013.01); G01N 1/38 (2013.01); G01N 35/1081 (2013.01); G01N 2001/021 (2013.01); G01N 2001/1025 (2013.01); G01N 2001/1031 (2013.01); G01N 2001/1418 (2013.01); G01N 2001/388 (2013.01);
Abstract

The exemplary system and method configured to perform benthic flux incubation and measurement in an on-going continuous manner via motorized or non-motorized actuators that moves one or more sampling chambers (i) between different sampling regions or (ii) maintains the sampling chamber over a single region, for long term repeated measurements. The exemplary system and method can incubate and sample over multiple benthic sampling regions to acquire repeated measurements of both (i) fluxes and (ii) background processes and conditions (e.g., via ambient water incubations or ambient water concentration measurements), the results of which can be combined and processed by the exemplary system to generate data requiring minimal post-processing.

Find Patent Forward Citations

Beckler, Jordon. (2026). Long-term benthic incubation and measuring system and method (U.S. Patent No. 12601725). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12601725

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