The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Dec. 03, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Masafumi Miyake, Tokyo, JP;

Takushi Miyakawa, Tokyo, JP;

Tetsuji Kawahara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/416 (2006.01); G01N 27/333 (2006.01); G01N 35/08 (2006.01);
U.S. Cl.
CPC ...
G01N 27/416 (2013.01); G01N 27/333 (2013.01); G01N 35/08 (2013.01);
Abstract

The purpose of the present invention is to provide an automated analysis apparatus that can reduce the influence of a pre-sample more reliably, by delivering an internal standard solution. The automated analyzing apparatus according to the present invention determines in advance whether the ion concentration of a first sample is higher than the ion concentration of a second sample by a reference value, and delivers a liquid other than the sample in addition to the internal standard solution (see FIG.)


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