The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Dec. 18, 2023
Applicant:

The Boeing Company, Arlington, VA (US);

Inventors:

Amani Alonazi, Jeddah, SA;

Seema Chopra, Karnataka, IN;

Martin Szarski, Brighton East, AU;

Assignee:

The Boeing Company, Arlington, VA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/94 (2006.01); G01N 21/88 (2006.01); G01N 21/954 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 21/94 (2013.01); G06T 7/0004 (2013.01); G01N 2021/8887 (2013.01); G01N 2021/9544 (2013.01); G06T 2200/24 (2013.01); G06T 2207/30164 (2013.01);
Abstract

A system and a method for detecting foreign object debris in relation to a structure include a probe configured to move in relation to the structure. The probe includes a hyperspectral imaging device configured to acquire hyperspectral image data of one or more portions of the structure. A control unit is in communication with the hyperspectral imaging device. The control unit is configured to receive the hyperspectral image data from the hyperspectral imaging device, and analyze the hyperspectral image data to detect a presence of the foreign object debris.


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