The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Jul. 17, 2023
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Yu-Lun Liang, Redwood City, CA (US);
William C. Chueh, Menlo Park, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
Electrochemical reactivity is driven by the composition and structure of electrode surfaces. Monitoring surface chemistry in operando is thus crucial to understanding the behavior of electrodes yet is often inaccessible either due to resource limitations or to technical challenges in replicating realistic reaction environments. The invention presents a color impedance spectroscopy (CIS)-based technique to access operando surface measurements for mixed ionic-electronic conductors (MIECs). The CIS technique tunes the depth of charge carriers' movement within an electrode material by modulating the frequency of an applied AC electrochemical signal and monitors these changes spectroscopically. The results enable surface sensitivity in conventional bulk spectroscopies and provide new opportunities to characterize the operational behavior of MIEC electrodes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile