The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Oct. 19, 2023
Ccteg Coal Mining Research Institute, Beijing, CN;
Fuqiang Gao, Beijing, CN;
Jinhong Yang, Beijing, CN;
Shuwen Cao, Beijing, CN;
Jinfu Lou, Beijing, CN;
Rui Wu, Beijing, CN;
Lei Yang, Beijing, CN;
Xiaoqing Wang, Beijing, CN;
Jianzhong Li, Beijing, CN;
Shuangyong Dong, Beijing, CN;
Wenju Liu, Beijing, CN;
Guiyang Yuan, Beijing, CN;
CCTEG Coal Mining Research Institute, Beijing, CN;
Abstract
A method for measuring a liquid flow property is provided. The method includes controlling a droplet to drop from a preset height to a substrate, acquiring a droplet density on the substrate, a maximum radius of a tip of the droplet, a real-time height of the tip, an initial height of the tip, and a testing duration from a beginning of the droplet to fall on the substrate to an end of a test, determining that influencing factors of the tip of the droplet comprise inertial force and viscous force, and the inertial force is equal to the viscous force, and calculating a calculated viscosity of the droplet, wherein the calculated viscosity of the droplet is related to a first calculation coefficient, the droplet density, the maximum radius of the tip and the initial height of the tip, and the first calculation coefficient is equal to a ratio of a tip height change value to the testing duration, wherein the tip height change value is a difference between the initial height of the tip and the real-time height of the tip.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile