The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Nov. 28, 2023
Applicant:

Tsinghua University, Beijing, CN;

Inventors:

Ying Liu, Beijing, CN;

Mingyan Zhao, Beijing, CN;

Assignee:

TSINGHUA UNIVERSITY, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 5/00 (2006.01);
U.S. Cl.
CPC ...
G01L 5/0028 (2013.01);
Abstract

The present application provides a simulated eggshell perforation test device, which includes a simulated eggshell and a perforation device for perforating at a preset perforation position of the simulated eggshell. The simulated eggshell is an eggshell that is enlarged multiple times in proportion to an egg, thereby solving the problem that due to small size of the egg, the stress detector cannot be attached to a surface of the egg or has inaccurate detection data after attaching. The simulated eggshell is enlarged proportionally, its size is much larger than the egg, such that it is easier to attach the stress detector. After the stress detector is attached on the simulated eggshell, the perforation device is used to perforate the simulated eggshell. Based on the data detected by the stress detector, the most suitable perforation condition is figured out to reduce the occurrence of crack during eggshell perforation.


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