The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Jan. 19, 2023
Applicant:

Teledyne Flir Commercial Systems, Inc., Goleta, CA (US);

Inventors:

Brian B. Simolon, Goleta, CA (US);

Naseem Y. Aziz, Goleta, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/22 (2006.01); H04N 25/21 (2023.01); H04N 25/767 (2023.01); H04N 25/78 (2023.01);
U.S. Cl.
CPC ...
G01J 5/22 (2013.01); H04N 25/21 (2023.01); H04N 25/767 (2023.01); H04N 25/78 (2023.01);
Abstract

Techniques for facilitating vacuum health detection for imaging systems and methods are provided. In one example, an imaging device includes a detector configured to generate a first reference signal. The imaging device further includes a buffer circuit configured to store a value of the first reference signal. The imaging device further includes a processing circuit coupled to the buffer circuit. The processing circuit is configured to determine a first predetermined value based on a first temperature associated with the detector. The processing circuit is further configured to determine vacuum integrity associated with the detector based at least on the value of the first reference signal and the first predetermined value. Related methods and systems are also provided.


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