The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Dec. 19, 2022
Applicant:

Thermo Electron Scientific Instruments Llc, Madison, WI (US);

Inventors:

Alexander Grenov, Madison, WI (US);

Min Yan, Verona, WI (US);

Mike Bradley, Fitchburg, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01N 21/35 (2014.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0237 (2013.01); G01N 21/359 (2013.01); G01N 2021/3595 (2013.01); G01N 2201/127 (2013.01);
Abstract

Methods and systems for automatically adjusting a sample position in a spectrometer, such as a Fourier-transform infrared (FTIR) spectrometer, are described. The sample may be automatically positioned using an auto-focusing procedure. For example, images including an aperture marker are acquired by directing light towards the sample via an aperture. The sample position may be adjusted based on features extracted from the aperture marker images.


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