The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Mar. 02, 2023
Applicant:

Ckd Corporation, Aichi, JP;

Inventors:

Hiroyuki Ishigaki, Aichi, JP;

Ikuo Futamura, Aichi, JP;

Takahiro Mamiya, Aichi, JP;

Assignee:

CKD Corporation, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 9/023 (2006.01); G01B 11/25 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01); G01B 9/023 (2013.01); G01B 11/25 (2013.01); G06T 7/70 (2017.01); G06T 2207/30148 (2013.01);
Abstract

A three-dimensional measurement device includes: an irradiator that emits a predetermined light; an optical system that splits the predetermined light into two lights, irradiates a measurement object with a measurement light and irradiates a reference plane with a reference light, and emits a combined light; an imaging device that takes an image of the combined light and obtains an interference fringe image; an objective lens for the measurement light that directs the measurement light toward the measurement object; an objective lens for the reference light that directs the reference light toward the reference plane; an imaging lens that forms an image of the combined light on the imaging device; and a control device that executes three-dimensional measurement of a measurement area on the measurement object based on the interference fringe image.


Find Patent Forward Citations

Loading…