The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Dec. 28, 2020
Applicants:

Aecc Shanghai Commercial Aircraft Engine Manufacturing Co., Ltd., Shanghai, CN;

Aecc Commercial Aircraft Engine Co., Ltd., Shanghai, CN;

Inventors:

Yali Li, Shanghai, CN;

Liming Lei, Shanghai, CN;

Jun Fu, Shanghai, CN;

Yanli He, Shanghai, CN;

Yinlan Zheng, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 10/28 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B22F 10/28 (2021.01); B22F 10/38 (2021.01); B22F 10/85 (2021.01); B22F 12/90 (2021.01); B33Y 10/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

A non-destructive testing method for lack-of-fusion (LOF) defects, and a testing standard part and a manufacturing method thereof, used for the non-destructive testing of LOF defects of an additive manufacturing workpiece. The manufacturing method of the LOF defect standard part comprises: step A, setting a LOF defect area of the standard part, in the LOF defect area, a proportion of the LOF defects in the LOF defect area is set as a first proportion value; step B, selecting an additive manufacturing forming process for manufacturing the LOF defect area to obtain a first process parameter of the additive manufacturing forming process corresponding to the first proportion value; step C, performing the additive manufacturing forming process based on the first process parameter to form the LOF defect area.


Find Patent Forward Citations

Li, Yali. (2026). Non-destructive testing method for lof defects, and a testing standard part and manufacturing method therefor (U.S. Patent No. 12599967). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12599967

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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