The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Mar. 20, 2024
Shantou Institute of Ultrasonic Instruments Co., Ltd., Shantou, CN;
Liexiang Fan, Shantou, CN;
Delai Li, Shantou, CN;
Zehang Cai, Shantou, CN;
Bin Li, Shantou, CN;
Zhonghong Wu, Shantou, CN;
Yu Wang, Shantou, CN;
Jinhao Lin, Shantou, CN;
Shaohui Chen, Shantou, CN;
Weiwu Chen, Shantou, CN;
Jingfeng Guo, Shantou, CN;
Yijie Chen, Shantou, CN;
Shantou Institute of Ultrasonic Instruments Co., Ltd., Shantou, CN;
Abstract
An ultrasound automated detection and display method of cranial abnormal regions includes: firstly, a skull surface model is constructed; then contour detection is carried out based on a two-dimensional ultrasonic image to obtain a skull contour curve; fitting is carried out on the contour curve and the skull surface model to determine whether the two-dimensional ultrasonic image has symmetry characteristics or not; finally, similarity comparison calculation is carried out on two mutually symmetrical regions by utilizing the symmetry characteristics of the two-dimensional image, so that whether an abnormal region exists and the location of the abnormal region is determined. The method has the advantages that a skull surface model is constructed before detecting a cranial contour curve on a two-dimensional ultrasonic image.