The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 14, 2026
Filed:
Jan. 19, 2024
Fujifilm Healthcare Corporation, Chiba, JP;
Isao Takahashi, Chiba, JP;
Kazuki Matsuzaki, Chiba, JP;
Keisuke Yamakawa, Chiba, JP;
Tadashi Nakamura, Chiba, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided is an X-ray imaging apparatus that can understand a three-dimensional position of a treatment tool in real time during a medical operation without rotating a column of an X-ray tube. A first X-ray tube is disposed at a position at which a target part of a subject placed on a top plate is irradiated with X-rays, and a second X-ray tube is disposed by causing the second X-ray tube to move rotationally along a circular orbit about an axis connecting the first X-ray tube and the top plate. A first X-ray image is acquired by irradiating the subject with the X-rays from the first X-ray tube. A second X-ray image is acquired by irradiating the subject with X-rays from the second X-ray tube. A position of an image of a predetermined feature part included in the first X-ray image and a position of an image of the feature part included in the second X-ray image are used to calculate a three-dimensional position of the image of the predetermined feature part.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile