The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Sep. 12, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Junhyeok Ahn, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/033 (2006.01); H01L 21/308 (2006.01); H01L 21/762 (2006.01); H10B 12/00 (2023.01);
U.S. Cl.
CPC ...
H01L 21/0337 (2013.01); H01L 21/0332 (2013.01); H01L 21/3081 (2013.01); H01L 21/3086 (2013.01); H01L 21/76229 (2013.01); H10B 12/053 (2023.02); H10B 12/50 (2023.02);
Abstract

A semiconductor device fabrication method includes forming a substrate having first and second regions therein, with different densities of active regions in the first and second regions. A cell trench is formed, which defines cell active regions in the first region, and a peripheral trench is formed, which defines peripheral active regions in the second region. A first insulating layer is formed in the cell trench and the peripheral trench. A mask is selectively formed, which covers the first insulating layer in the first region and exposes the first insulating layer in the second region. A second insulating layer is formed on the first insulating layer in the second region exposed by the mask, using a selective dielectric-on-dielectric deposition process. The first insulating layer is exposed in the first region by removing the mask. A third insulating layer is formed on the first insulating layer in the first region and on the second insulating layer in the second region.


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