The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Mar. 26, 2021
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Jing He, Beijing, CN;

Ping Yuan, Beijing, CN;

Lei Du, Beijing, CN;

Lars Dalsgaard, Oulu, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01);
Abstract

Disclosed are methods for configuring measurement gap patterns. An example method may include: receiving configuration information associated with a plurality of pre-configured measurement gap patterns; receiving index information for configuring at least one measurement gap pattern of a bandwidth part; and configuring the at least one measurement gap pattern of the bandwidth part based on at least one of the configuration information and the index information. Related apparatuses and computer readable media are also disclosed.


Find Patent Forward Citations

He, Jing. (2026). Methods, apparatuses, and computer readable media for configuring measurement gap patterns (U.S. Patent No. 12598500). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12598500

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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