The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Sep. 14, 2023
Applicant:

Accunose Co., Ltd., Gyeonggi-do, KR;

Inventors:

Won Il Lee, Gyeonggi-do, KR;

Young Hyeon Park, Gyeonggi-do, KR;

Assignee:

Accunose Co., LTD., Gyeonggi-do, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/957 (2023.01); G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
H04N 23/957 (2023.01); G02B 21/0044 (2013.01); G02B 21/361 (2013.01);
Abstract

Light field microscope-based image acquisition apparatuses and methods are provided. The light field microscope-based image acquisition apparatus includes a lenslet synthesis processing unit configured to acquire a virtual lenslet image using a multi-lenslet image group; a sub-aperture image conversion unit configured to convert the virtual lenslet image generated in the lenslet synthesis processing unit into a sub-aperture image; and a 3D conversion unit configured to convert the sub-aperture image generated in the sub-aperture image conversion unit into a focal-stack image.


Find Patent Forward Citations

Lee, Won. (2026). Light field microscope-based image acquisition method and apparatus (U.S. Patent No. 12598400). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12598400

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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