The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Sep. 25, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Deepak Agarwal, San Diego, CA (US);

Michael Francis Garyantes, Bradley Beach, NJ (US);

Abhishek Saurabh Sachidanand Sinha, San Diego, CA (US);

James Krysl, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 5/00 (2006.01); H04B 7/06 (2006.01); H04W 56/00 (2009.01); H04W 72/0446 (2023.01);
U.S. Cl.
CPC ...
H04L 5/0051 (2013.01); H04B 7/0615 (2013.01); H04W 56/0045 (2013.01); H04W 72/0446 (2013.01);
Abstract

Methods, systems, and devices for wireless communications are described. A remote unit (RU) may transmit, to a distributed unit (DU), an indication of a skew time parameter associated with providing compensated samples for a plurality of symbols associated with a slot. The RU may store a set of samples associated with a first subset of the plurality of symbols associated with the slot, the storing based on a processing delay associated with receiving demodulation reference signals during a portion of the first subset of the plurality of symbols associated with the slot. The RU may transmit, to the DU, a burst of compensated samples for the plurality of symbols in a transmission window that is offset in time from a beginning symbol of the slot according to the skew time parameter.


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