The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Sep. 26, 2023
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventors:

Kurt Chamberlin, Bristol, RI (US);

Matthew Edward Gilbert-Eyres, Rochester Hills, MI (US);

Gayanie Jayasinghe, Southfield, MI (US);

Noah Stone, West Bloomfield, MI (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); G01P 1/07 (2006.01); G07C 5/00 (2006.01); G07C 5/10 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0816 (2013.01); G01P 1/07 (2013.01); G07C 5/008 (2013.01); G07C 5/10 (2013.01);
Abstract

An impact monitoring system for a vehicle includes data processing hardware and memory hardware in communication with the data processing hardware. The memory hardware stores instructions that when executed on the data processing hardware cause the data processing hardware to perform operations. The operations performed by the data processing hardware include receiving sensor data from a plurality of sensors disposed along the vehicle and identifying an impact event based on the sensor data. The sensor data and the identified impact event are compared with a series of impact thresholds, and an impact score is determined based on the comparison of the sensor data and the identified impact event with the series of impact thresholds. The impact score is compared with an impact score hierarchy, the impact score hierarchy corresponding to the series of impact thresholds, and the impact event is monitored using updated sensor data.


Find Patent Forward Citations

Loading…