The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Mar. 09, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Florian Beye, Tokyo, JP;

Yusuke Shinohara, Tokyo, JP;

Hayato Itsumi, Tokyo, JP;

Charvi Vitthal, Tokyo, JP;

Koichi Nihei, Tokyo, JP;

Takanori Iwai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/776 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/776 (2022.01);
Abstract

A model learning device determines a first machine learning model so as to further increase a combined loss function obtained by combining: a first loss function indicating the level of change in the reliability of a second image feature in a feature region of a reconstructed image, from the reliability of a first image feature in a feature region of the original image; and a second loss function indicating the level of recognition error. In addition, the model learning device: determines, so as to further reduce the combined loss function, respective parameter sets for a second machine learning model used in the generation of compressed data, and a third machine learning model used in the generation of the reconstructed image from the compressed data; and determines a parameter set for the fourth machine learning model in common with that for the first machine learning model.


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