The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Jun. 15, 2023
Hitachi, Ltd., Tokyo, JP;
Lasitha Sandaruwan Vidyaratne, Fremont, CA (US);
Xian Yeow Lee, Santa Clara, CA (US);
Mahbubul Alam, Fremont, CA (US);
Ahmed Farahat, Santa Clara, CA (US);
Dipanjan Ghosh, Santa Clara, CA (US);
Maria Teresa Gonzalez Diaz, Mountain View, CA (US);
Chetan Gupta, Sunnyvale, CA (US);
HITACHI, LTD., Tokyo, JP;
Abstract
Systems and methods described herein which can involve for a first input of a plurality of labeled images of a new domain task, processing the first plurality of labeled images through a plurality of backbone snapshots, each of the backbone snapshots representative of a model trained across a plurality of other domain tasks, each of the plurality of backbone snapshots configured to output a first plurality of features responsive to the input; processing a second input of second plurality of unlabeled images through the plurality of backbone snapshots to output a second plurality of features responsive to the second input; and generating a representative model for the new domain task from the clustering and transformation of the first plurality of features and as associated from the clustered and transformed second plurality of features.