The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Jul. 11, 2023
Vivotek Inc., New Taipei City, TW;
Chao-Tan Huang, New Taipei City, TW;
VIVOTEK INC., New Taipei City, TW;
Abstract
An image analysis method is applied to a camera apparatus and used to analyze the landform inside a detection image captured by the camera apparatus via a predefined installation angle. The image analysis method includes dividing the detection image into a plurality of first regions to acquire a plurality of first height, defining some first regions with the same height and adjacent to each other as a first reference plane area to acquire a first plane formula, selecting at least one first region adjacent to and outside the first reference plane area, applying the selected first region for the first plane formula to acquire a first planar height and comparing the first planar height with an initial first height of the at least one first region, and determining landform between the first reference plane area and the selected at least one first region in accordance with a comparison result.