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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12597120 B1

PDFFull Text
Date of Patent:
Apr. 07, 2026

Filed:

Mar. 06, 2023

Printed image defect discrimination device and method displaying detected defects in list by type in display mode according to state of defect

Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Mitsuhiro Yamashita, Matsumoto, JP;

Naoki Hagihara, Shiojiri, JP;

Yuko Yamamoto, Shiojiri, JP;

Takahiro Kamada, Matsumoto, JP;

Takuya Ono, Shiojiri, JP;

Assignee:

Seiko Epson Corporation, Tokyo, JP;

Attorney:

WORKMAN NYDEGGER

Primary Examiner:

Scott A Rogers

Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); H04N 1/00015 (2013.01); H04N 1/00045 (2013.01); H04N 1/00068 (2013.01); H04N 1/00074 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30144 (2013.01);
Abstract

A defect discrimination device for printed image includes an inspection image acquisition section configured to acquire an inspection image by imaging a print medium on which an image is printed, the image corresponding to a reference image that becomes a reference of an image in which a defect is to be detected; a defect detection section configured to detect a state of the defect, the state including a defect type of the defect included in the printed inspection image; and a display section configured to display a display image corresponding to the inspection image, and an inspection result display section configured to display the detected defect together with the defect type of the defect, in a display mode according to the state of the defect.

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Quick Actions:

Yamashita, Mitsuhiro. (2026). Printed image defect discrimination device and method displaying detected defects in list by type in display mode according to state of defect (U.S. Patent No. 12597120). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12597120

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