The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Jul. 10, 2023
Toyo Seikan Co., Ltd., Tokyo, JP;
Takayuki Kikuchi, Yokohama, JP;
Junichi Takada, Yokohama, JP;
Kazuhiko Nakayama, Yokohama, JP;
Taketoshi Manou, Yokohama, JP;
TOYO SEIKAN CO., LTD., Tokyo, JP;
Abstract
An abnormality detection method includes: acquiring a determination target image that is an image of a determination target object to be regularly aligned while standing, which is a cylindrical container; creating a difference image emphasizing a difference between an image of a normal determination target object regularly aligned and the determination target image; calculating a multi-segmentation error of the difference image to determine a maximum value of the multi-segmentation error; and determining whether the determination target object is normal or abnormal in accordance with the maximum value.