The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Mar. 04, 2021
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Shigeaki Namiki, Tokyo, JP;
Takuya Ogawa, Tokyo, JP;
Keiko Inoue, Tokyo, JP;
Shoji Yachida, Tokyo, JP;
Toshinori Hosoi, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01); G06V 10/26 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 7/11 (2017.01); G06V 10/267 (2022.01); G06V 10/762 (2022.01); G06V 10/764 (2022.01); G06T 2207/10016 (2013.01);
Abstract
In an inspection device, a classification means classifies temporal captured images which capture a target object, into a plurality of groups. A recognition means recognizes the captured images belonging to each of the groups, and outputs a determination result for each of the groups. An integration means integrates respective determination results of the groups, and outputs a final determination result.
Namiki, Shigeaki. (2026). Inspection device, inspection method, and recording medium (U.S. Patent No. 12597112). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12597112
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile