The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Nov. 26, 2020
Boe Technology Group Co., Ltd., Beijing, CN;
Quanguo Zhou, Beijing, CN;
Kaiqin Xu, Beijing, CN;
Jiahong Zou, Beijing, CN;
Guolin Zhang, Beijing, CN;
Xun Huang, Beijing, CN;
Qing Zhang, Beijing, CN;
Lijia Zhou, Beijing, CN;
Zhidong Wang, Beijing, CN;
Hongxiang Shen, Beijing, CN;
Hao Tang, Beijing, CN;
Jiuyang Cheng, Beijing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Abstract
Provided are a method and apparatus for identifying the defect grade of a bad picture, and a storage medium. The method includes: determining the defect size of a defect from a bad picture; according to a product model corresponding to the bad picture, determining the design size of a pattern corresponding to a component that is adjacent to the position of the defect; determining the defect grade of the defect according to the defect type of the defect and a magnitude relationship between the defect size and the design size, wherein the defect grade is the degree to which the defect affects product yield.