The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Mar. 21, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Daniel Jakub Ryszka, Cracow, PL;

Lukasz G. Cmielowski, Cracow, PL;

Jan Soltysik, Cracow, PL;

Szymon Kucharczyk, Cracow, PL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3676 (2013.01); G06F 11/3688 (2013.01);
Abstract

A method for generating tests of a machine learning (ML) engine includes determining a feature space of the set of configuration parameters of at least part of initial test cases of the ML engine. One or more areas of low coverage may be identified in the feature space. A configuration of a new test case may be defined such that the new test case covers a low coverage area of the feature space. The new test case may be provided for testing a performance of the ML engine to find a ML model using an input dataset according to the configuration of the new test case.


Find Patent Forward Citations

Ryszka, Daniel. (2026). Testing a machine learning model (U.S. Patent No. 12596634). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12596634

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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