The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

May. 30, 2024
Applicant:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Inventors:

Vilas Sridharan, Boston, MA (US);

Jeffrey William Kellington, Austin, TX (US);

Naveen Krishna Chatradhi, Bangalore, IN;

Sivakumar Sathappan, Bangalore, IN;

Assignee:

Advanced Micro Devices, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0787 (2013.01); G06F 11/073 (2013.01); G06F 11/0793 (2013.01); G06F 11/1417 (2013.01);
Abstract

Defect tracking within a computing environment includes storing a retired page table within a read only memory (ROM) of a computing node. A hardware processor of the computing node detects one or more System-on-Chips (SoCs) within the computing node. The hardware processor reads the retired page table from the read only memory. The hardware processor compares records of the retired page table with the one or more SoCs within the computing node. For each record of the retired page table that matches the one or more SoCs within the computing node, one or more physical pages of a volatile memory of the one or more SoCs are retired based on each record.


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