The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Aug. 29, 2023
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Kalyani Bharat Zope, Pune, IN;

Kuldeep Singh, Pune, IN;

Sri Harsha Nistala, Pune, IN;

Venkataramana Runkana, Pune, IN;

Tanmaya Singhal, Pune, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4184 (2013.01); G05B 19/4183 (2013.01); G05B 19/41885 (2013.01);
Abstract

Existing systems for fault detection and classification have the disadvantage that they have limited or no capability for fault localization and root cause identification, probably due to the challenges associated with modeling the nonlinear interactions among process variables and capturing the nonstationary behavior that is typical of most industrial processes. The disclosure herein generally relates to industrial manufacturing systems, and, more particularly, to method and system for localization of faults in an industrial manufacturing plant. The system uses a perturbation based approach for fault localization, in which the system determines variables having dominant effect on identified faults, in terms of a perturbation score calculated for each of the variables.


Find Patent Forward Citations

Zope, Kalyani. (2026). Method and system for localization of faults in an industrial manufacturing plant (U.S. Patent No. 12596356). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12596356

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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