The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Oct. 27, 2022
Applicant:
Kabushiki Kaisha Yaskawa Denki, Kitakyushu, JP;
Inventors:
Ayaka Hashimoto, Kitakyushu, JP;
Tadashi Okubo, Kitakyushu, JP;
Takashi Kitazawa, Kitakyushu, JP;
Tsuyoshi Yokoya, Kitakyushu, JP;
Assignee:
KABUSHIKI KAISHA YASKAWA DENKI, Kitakyushu, JP;
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/414 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4184 (2013.01); G05B 19/4183 (2013.01); G05B 19/4188 (2013.01);
Abstract
An abnormality information estimation system includes processing circuitry that identifies, based on operation data related to an operation of an industrial device that controls a mechanism, multiple unit phenomena due to the operation, and estimates abnormality information about an abnormality occurring in the mechanism based on the multiple of unit phenomena.