The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Apr. 08, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Florian Fahrbach, Mannheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An inclined plane microscope includes a detection assembly for collecting scattered light and/or fluorescent light from regions of a sample volume illuminated by a light sheet, wherein the detection assembly, on its side facing away from the sample volume, is configured to image a real intermediate image of the regions of the sample illuminated by the light sheet, and wherein the real intermediate image is tilted in relation to a focal plane of the detection assembly, and an optical alignment unit for imaging a predetermined image field of the real intermediate image onto a detector, wherein the alignment unit has a depth of field region, wherein a focal plane of the alignment unit is tilted in relation to the real intermediate image, and wherein the predetermined image field of the real intermediate image to be imaged by the alignment unit is located completely within the depth of field region.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile