The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Jan. 10, 2024
China Special Equipment Inspection and Research Institute, Beijing, CN;
Gongtian Shen, Beijing, CN;
Zunxiang Wang, Beijing, CN;
Ran Liu, Beijing, CN;
Zhao Zhao, Beijing, CN;
Zhimao Xu, Beijing, CN;
Wei Zhao, Beijing, CN;
Abstract
The present disclosure provides a system and method for testing performance of a relay contact based on infrared thermal imaging, and relates to the field of performance testing of relay contacts. The system includes a collection device, a testing device, and a time relay. The testing device is separately connected to a tested relay and the time relay, and configured to control closing and release of a contact of the tested relay by using the time relay. The collection device is connected to the testing device, and configured to collect a temperature, a closing quantity, and working duration of the contact of the tested relay. The present disclosure resolves a limitation in existing performance testing methods for intermediate relays, which predominantly concentrate on individual parameters like voltage, current, and time, while overlooking the assessment of contact performance.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile