The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Jan. 26, 2021
Hitachi High-tech Corporation, Tokyo, JP;
Hitomi Tsuji, Tokyo, JP;
Yuya Matsuoka, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
Provided is an automatic analyzer capable of appropriately controlling most of the temperature of an incubator even when local temperature fluctuation occurs. An automatic analyzer for analyzing a specimen includes an incubator for holding a plurality of vessels that store a mixed liquid of the specimen and a reagent, a heat source for heating or cooling the incubator, a plurality of temperature sensors provided at different positions of the incubator and measuring the temperature, and a control unit for controlling an output of the heat source based on a difference between a target temperature and the highest temperature or the lowest temperature among the measured temperatures of the temperature sensors.