The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Jun. 12, 2023
Applicant:

Triad National Security, Llc, Los Alamos, NM (US);

Inventors:

Ian Thomas Cummings, Los Alamos, NM (US);

Adam Joseph Wachtor, Los Alamos, NM (US);

Eric Brian Flynn, Los Alamos, NM (US);

Erica Marie Jacobson, Los Alamos, NM (US);

Assignee:

Triad National Security, LLC, Los Alamos, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); G01N 29/04 (2006.01); G01N 29/26 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4445 (2013.01); G01N 29/045 (2013.01); G01N 29/26 (2013.01); G01N 2291/0289 (2013.01);
Abstract

Embodiments provide for nondestructive defect detection. Example embodiments provide for generating one or more excitation signals using one or more excitation devices coupled to a device under inspection, scanning an exterior surface of the device under inspection to collect sensor signals, and determining, based at least in part on the sensor signals, a presence or lack of a defect in the device under inspection. Either the device under inspection is rotated about an axis for a duration of the scanning or the scanning system is rotated around the device under inspection for the duration of the scanning.


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