The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Nov. 11, 2022
Inspection systems and methods employing different wavelength directional light for enhanced imaging
General Electric Company, Schenectady, NY (US);
Oliver Crispin Robotics Limited, Altrincham, GB;
Vamshi Krishna Reddy Kommareddy, Bangalore, IN;
Biswajit Medhi, Bangalore, IN;
Andrew Crispin Graham, Badminton, GB;
General Electric Company, Evendale, OH (US);
Oliver Crispin Robotics Limited, Altrincham, GB;
Abstract
An inspection system and related methods are provided. The inspection system includes an inspection camera, a plurality of light sources collocated with the inspection camera, and a post processing system. The plurality of light sources output directional light that have different respective ranges of light wavelengths. The inspection camera is configured to capture image data while a surface of interest is being illuminated with the directional light. Further, the post processing system is configured to receive the image data, process portions of the image data into a plurality of images that include distinct images corresponding to the different respective ranges of light wavelengths. The plurality of images can be reviewed to identify an abnormal region of the surface of interest.