The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Aug. 30, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Aihiko Numata, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/3581 (2014.01); G06T 7/70 (2017.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/3581 (2013.01); G06T 7/70 (2017.01); H04N 23/56 (2023.01);
Abstract

A camera system configured to inspect an inspection target moving in a first direction includes an illumination unit configured to irradiate the inspection target with a terahertz wave, and a camera unit disposed at a position which the terahertz wave reflected on the inspection target enters, and configured to acquire an image formed by the reflected terahertz wave. The illumination unit includes a plurality of illumination elements two-dimensionally arranged in the first direction and a second direction different from the first direction. Angles formed between directions of optical axes of the plurality of illumination elements arranged in the second direction projected onto a first plane that includes a straight line in the first direction and a straight line in the second direction and the first direction become smaller as a position approaches a center portion of the plurality of illumination elements arranged in the second direction.


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