The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Jul. 11, 2023
Applicant:

Asm Ip Holding, B.v., Almere, NL;

Inventor:

Rami Khazaka, Leuven, BE;

Assignee:

ASM IP Holding B.V., Almere, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 25/16 (2006.01); C23C 16/24 (2006.01); C23C 16/455 (2006.01); C23C 16/52 (2006.01); C30B 25/12 (2006.01); C30B 29/06 (2006.01); C30B 29/68 (2006.01); H01L 21/02 (2006.01); H10B 12/00 (2023.01);
U.S. Cl.
CPC ...
C30B 25/165 (2013.01); C23C 16/24 (2013.01); C23C 16/45529 (2013.01); C23C 16/45546 (2013.01); C23C 16/52 (2013.01); C30B 25/12 (2013.01); C30B 29/06 (2013.01); C30B 29/68 (2013.01); H01L 21/0245 (2013.01); H01L 21/02532 (2013.01); H01L 21/02576 (2013.01); H01L 21/0262 (2013.01); H01L 21/02381 (2013.01); H01L 21/02433 (2013.01); H10B 12/01 (2023.02);
Abstract

A method for forming an epitaxial stack on a plurality of substrates comprises providing a plurality of substrates to a process chamber and executing deposition cycles, wherein each deposition cycle comprises a first deposition pulse and a second deposition pulse. The epitaxial stack comprises a first epitaxial layer stacked alternatingly and repeatedly with a second epitaxial layer, the second epitaxial layer being different from the first epitaxial layer. The first deposition pulse comprises a provision of a first reaction gas mixture to the process chamber, thereby forming the first epitaxial layer having a first native lattice parameter. The second deposition pulse comprises a provision of a second reaction gas mixture to the process chamber, thereby forming the second epitaxial layer having a second native lattice parameter, wherein the first native lattice parameter lies in a range within 1.5% larger than and 0.9% smaller than the second native lattice parameter.


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