The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2026

Filed:

Nov. 16, 2022
Applicant:

Bruker Daltonics Gmbh & Co. KG, Bremen, DE;

Inventor:

Katrin Sparbier, Bremen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/18 (2006.01); G01N 33/68 (2006.01); G16B 20/00 (2019.01); G16B 40/10 (2019.01);
U.S. Cl.
CPC ...
C12Q 1/18 (2013.01); G01N 33/6851 (2013.01); G16B 20/00 (2019.02); G16B 40/10 (2019.02);
Abstract

The invention relates to methods for spectrometric characterization of a test cell substrate. The characterization comprises taxonomic classification and determination of a property of interest of the test cell substrate. The characterization may be based on mass-spectrometric measurement data. The property of interest may be a resistance or susceptibility to a growth-influencing factor. After comparing first spectrometric measurement data of the test cell substrate with a provided reference library, a sub-library is created comprising those reference datasets from the reference library that are classified as allowing a taxonomic classification of the test cell substrate. Second spectrometric measurement data after a second preparation of the test cell substrate under conditions that serve to determine a property of interest of the test cell substrate is compared with the sub-library and allow a reliable determination of the property of interest.


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