The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Mar. 22, 2023
Hydro Aluminium Recycling Deutschland Gmbh, Dormagen, DE;
Hydro Aluminium Recycling Deutschland GmbH, Dormagen, DE;
Abstract
The invention relates to a system for analyzing and sorting a material part, in particular a scrap part made of aluminum, comprising: —a feed means () for transporting the material part (), —a sorting unit () which is designed to feed the material part () to one of two fractions (F, F), —a laser device () which is designed to generate a plasma () on a surfaceA of the material part () using a laser beam () which propagates along a beam axis (A), —a spectrometer system () which is designed to carry out a spectral analysis of a plasma light (A) emitted from the laser-induced plasma () and to generate an output signal in accordance with the result of the spectral analysis that is carried out, and—a controller () which is designed to receive the output signal and operate the sorting unit () on the basis of the output signal and a sorting criterion, wherein—the spectrometer system () has a spectrometer () and a detection unit () which is optically connected to the spectrometer (), and—the detection unit () has an objective (A,B,C,D) which is paired with a detection cone () that forms a plasma detection region () in a region () overlapping with the laser beam (). The invention is characterized in that the detection unit () has an additional objective (A,B,C,D) which is paired with an additional detection cone () that forms an additional plasma detection region () in an additional region () overlapping with the laser beam (). The objectives (A,B,C,D) are arranged and/or aligned in relation to one another such that the plasma detection region () and the additional plasma detection region () are arranged in an offset manner along the beam axis (A) of the laser beam () and together form a viewing region () of the detection unit ().
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