The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Dec. 06, 2022
Topcon Corporation, Tokyo, JP;
Yoshikiyo Moriguchi, Tokyo, JP;
Akiko Ishikawa, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
An ophthalmic apparatus includes an interference optical system, an optical scanner controller, and a correction controller. The interference optical system includes an astigmatism correction optical member and an optical scanner, and is configured to split light from a light source into reference light and measurement light, to irradiate the measurement light onto the subject's eye via the astigmatism correction optical member and the optical scanner, and to detect interference light between returning light of the measurement light from the subject's eye and the reference light. The optical scanner controller is configured to control the optical scanner so as to deflect the measurement light in a horizontal direction and a vertical direction on a plane perpendicular to an optical axis of the interference optical system. The correction controller is configured to control the astigmatism correction optical member so as to correct astigmatism based on a detection result of the interference light obtained by the interference optical system.