The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
May. 31, 2023
Applicant:
Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;
Inventor:
Yongquan Ye, Houston, TX (US);
Assignee:
SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 5/055 (2006.01); A61B 6/00 (2006.01); G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
A61B 6/5258 (2013.01); G06T 7/0012 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A method and a system for noise analysis may be provided. A plurality of signals of a target object may be obtained. A first value of a first signal representation and a second value of a second signal representation of the target object may be determined based on the plurality of signals. A value of a noise parameter may be determined based on the first value of the first signal representation and the second value of the second signal representation.