The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 07, 2026
Filed:
Mar. 14, 2024
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Shinichiro Konno, Kanagawa, JP;
Takashi Tajima, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/50 (2024.01); A61B 6/12 (2006.01); A61B 10/02 (2006.01); A61B 34/20 (2016.01);
U.S. Cl.
CPC ...
A61B 6/502 (2013.01); A61B 6/12 (2013.01); A61B 10/0233 (2013.01); A61B 34/20 (2016.02); A61B 2034/2046 (2016.02);
Abstract
A calibration jig is attached to a biopsy apparatus used in combination with a mammography apparatus, and that is for performing calibration to match three-dimensional coordinate systems of the mammography apparatus and the biopsy apparatus, and the calibration jig includes a pseudo biopsy needle that is a pseudo needle of a biopsy needle that is actually used in the biopsy apparatus; and a marker that has a plurality of parts each of which a positional relationship with a needle tip of the pseudo biopsy needle is known.