The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Nov. 14, 2022
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Ryo Ogura, Tokyo, JP;

Takahiro Maruyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10B 51/40 (2023.01); H10B 51/30 (2023.01); H10D 30/01 (2025.01); H10D 30/69 (2025.01); H10D 64/68 (2025.01);
U.S. Cl.
CPC ...
H10B 51/40 (2023.02); H10B 51/30 (2023.02); H10D 30/0415 (2025.01); H10D 30/701 (2025.01); H10D 64/689 (2025.01);
Abstract

This is a manufacturing method of a semiconductor device having a first region, a second region, and a third region. A second gate dielectric film is formed on a semiconductor substrate in the second region. A thin first gate dielectric film is formed on the semiconductor substrate in the first region. A protective film is formed on the first gate dielectric film and on the second gate dielectric film. A thin paraelectric film is formed on the semiconductor substrate in the third region. An amorphous film formed of a material including a metal oxide and a first element is formed on the protective film and on the paraelectric film. A metal film is formed on the amorphous film. By performing a heat treatment, the amorphous film is crystallized to form a ferroelectric film.


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