The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
May. 31, 2024
Applicant:
Institut National DE LA Recherche Scientifique, Québec, CA;
Inventors:
Jinyang Liang, Boucherville, CA;
Xianglei Liu, Longueuil, CA;
Assignee:
INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Québec, CA;
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/959 (2023.01); H04N 23/957 (2023.01);
U.S. Cl.
CPC ...
H04N 23/959 (2023.01); H04N 23/957 (2023.01);
Abstract
A diffraction-gated real-time ultrahigh-speed mapping photography method and system, by probing a transient scene with a single-wavelength continuous-wave beam, imaging the probed transient scene, generating different replicated images of the transient scene at spatially separated positions by using a 4f imaging system and a spatial light modulator, and rescaling the images size onto a low-speed CMOS or CCD camera for example, synchronizing with the flipping of the spatial light modulator for recording images of the transient scene.