The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Dec. 27, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Yoshiyuki Ohno, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/14 (2006.01);
U.S. Cl.
CPC ...
H04L 9/14 (2013.01);
Abstract

A code conversion apparatus first combines key columns, and detects a first function code for executing a grouping operation for each combined key column, next detects a key column name from the first function code, next generates a group key using the key column name for each two-dimensional array data of the first function code, next detects overlap key column names in the group keys, and generates an overlap group composed of the overlap key column names, next adds a second function code for executing a grouping operation using the overlap group name of the overlap group and the key column names constituting the overlap group, and a third function code for adding the overlap group name to the two-dimensional array data as a key column, and next replaces the key column name used in the overlap group included in the first function code with the overlap group name.


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