The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 31, 2026

Filed:

Jun. 05, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Takuma Amada, Tokyo, JP;

Kazuya Kakizaki, Tokyo, JP;

Toshinori Araki, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01);
Abstract

An adversarial example detection device includes a first feature extraction unit configured to extract first features with respect to input data and comparative data in a first calculation method, a second feature extraction unit configured to extract second features with respect to the input data and the comparative data in a second calculation method different from the first calculation method, and a determination unit configured to determine whether or not at least one piece of the input data and the comparative data is an adversarial example through calculation using the first features and the second features.


Find Patent Forward Citations

Amada, Takuma. (2026). Adversarial example detection device, adversarial example detection method, and program (U.S. Patent No. 12592068). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12592068

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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