The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2026
Filed:
Sep. 15, 2021
Siemens Shanghai Medical Equipment Ltd., Shanghai, CN;
Yang Wang, Shanghai, CN;
Rui Kang Zhang, Shanghai, CN;
Kai Chen, Shanghai, CN;
Yi Tian, Shanghai, CN;
Siemens Shanghai Medical Equipment Ltd., Shanghai, CN;
Abstract
A method for predicting a scattered signal of an X-ray for an examination object includes: scanning each phantom in a scanning manner in which a scattering degree of each phantom in a plurality of phantoms is less than a reference scattering degree, so as to obtain first projection data of each phantom; scanning each phantom in a scanning manner in which the scattering degree of each phantom in the plurality of phantoms is equal to the reference scattering degree, so as to obtain second projection data of each phantom; obtaining a real scattered signal of each phantom by subtracting the first projection data of the phantom from the second projection data of the phantom; training a learning model based on the second projection data of each phantom and the real scattered signal of each phantom to obtain a trained learning model; and applying the trained learning model to projection data of the X-ray for the examination object to predict the scattered signal of the projection data of the X-ray.